C.C.P. Contact Probes Co., LTD.
Testing Solutions
- Testing Sockets
- IC Testing Probes
- ICT Testing Probes
- Wafer Level Test Solutions
The new high frequency pin has a compressible shield that effectivly blocks interferences even during the mating process.The design is also suitable for high voltage applications where a shield is necessary for insulation. It is USB 3 Gen 2 compatible and allows high speed transmission according to the USB specification.