C.C.P. Contact Probes Co., LTD.
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Testing Solutions
Introduction
Discover our capabilities in the testing of semiconductors!
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IC Test Probes
80 Designs
Our IC Test Probes are suitable for pitches of less than 0.12mm.
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ICT Test Probes
70 Designs
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts
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High Frequency (RF) Testing
≤ 77 GHz
CCP designs high-frequency testing probes, coaxial probe sockets, and pressurized conductive rubber sockets.
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Battery Probes
30 Designs
CCP offers a variety of different high current battery testing probes.
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Memory Testing
DDR SDRAM, Flash, etc.
Standard and Custom test solutions for RAM, Flash and many other memory chips.
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High Voltage IC Test Probes
> 5 Amps
Our patented probe design can carry extremely high currents of up to 5A.
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Fine Pitch Connector Test
≤ 0.3mm
Our Ceramic/Aluminum sockets have a lifetime of up to 30,000 cycles.
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Kelvin Contact Test
0.07 ~ 0.1mm
We offer different tip types for low resistance testing.
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ATE Connecting Solutions
Pogo Tower & Adapter
Customized pogo towers with high frequency capability.
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Panel Test Solution
Min pitch 0.45mm
CCP offers special spring contact pins with rounded tips for testing displays.
Can't find what you want?
CCP provides a wide variety of testing sockets and probes. You have a specific requirement or a totally new requirement?
Our Engineers looking forward to taking on your challenge!