C.C.P. Contact Probes Co., LTD.
Testing Standards
Others
Testing Items | Reference Document |
---|---|
Drop Test | Refer to Drop Test Standard of Molex |
Side Force | Refer to Side Force Standard of BENQ |
Solder Ability | EIA-364-52 |
Environmental Testing
Testing Items | Reference Document |
---|---|
Humidity | EIA-364-31, Test method II, Condition A |
Salt Spray | EIA-364-26, Test condition B |
Temperature Life | EIA-364-17, Test method A, condition 4, Test time condition A |
Thermal Shock (Cycling) | EIA-364-32, Test condition VIII |
Resistance to Solder Heat | EIA-364-56, Procedure 5, Level 2 |
Mechanical Performance
Testing Items | Reference Document |
---|---|
Contact Retention | EIA-364-29, Test method B |
Durability | EIA-364-09 |
Spring Force | EIA-364-04 (Normal Force Test Procedure) |
Random Vibration | EIA-364-28, Test condition II |
Mechanical Shock | EIA-364-27, Test condition A |
Electrical Performance
Testing Items | Reference Document |
---|---|
LLCR, Contact Resistance | EIA-364-23 |
Insulation Resistance | EIA-364-21 |
Dielectric Withstand Voltage | EIA-364-20, Test method B |
Current Rating | EIA-364-70, Test method 1 |