C.C.P. Contact Probes Co., LTD.
Double active, 7.8 mm, IC Test Probes, 0.38 mm Diameter, 1A
Double active, 7.8 mm, IC Test Probes, 0.38 mm Diameter, 1A
Category |
IC Test Probes
|
Part Number |
DE1-038FF50-03F0
|
Structure |
Double Active
|
Length |
7.80
|
Barrel Outer Diameter | |
Tip for DUT |
4 Points Crown(F)
|
Tip for Load Board |
4 Points Crown(F)
|
Rated Current |
1
|
Contact Resistance |
225
|
Datasheet | DE1-038FF50-03F0 Datasheet.pdf |
3D CAD | DE1-038FF50-03F0.STEP |
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Ships from | Taiwan |
Lead Time | 21 |
Product Specifications
Impedance | 43.29 |
Insertion Loss | -1dB@12.98GHz |
Return Loss | -20dB@3.20GHz |
Tip Base for DUT | BeCu Alloy |
Tip Plating for DUT | Au |
Tip Base for Loadboard | BeCu Alloy |
Tip Plating for Loadboard | Au |
Barrel Base | Phosphor Bronze |
Barrel Plating | Au |
Spring Base | SWP with Au plated |
Full Travel | 1.2 |
Recommended Travel | 1 |
Spring Force | 22 |
Life Cycle | 200K |
Operating Temperature | -15~125 |