C.C.P. Contact Probes Co., LTD.
Double active, 6.86mm, IC Test Probe, 0.35mm Diameter, 1A, DE1-035EG57-01A0
Double active, 6.86mm, IC Test Probe, 0.35mm Diameter, 1A, DE1-035EG57-01A0
Category |
IC Test Probes
|
Part Number |
DE1-035EG57-01A0
|
Structure |
Double Active
|
Length |
6.86
|
Barrel Outer Diameter | |
Tip for DUT |
Conical 90º,120º(E)
|
Tip for Load Board |
Flat(G)
|
Rated Current |
1
|
Contact Resistance |
50
|
Datasheet | DE1-035EG57-01A0.pdf |
3D CAD | DE1-035EG57-01A0.step |
Get a Quotation
Ships from | Taiwan |
Lead Time | 21 |
Product Specifications
Tip Base for DUT | BeCu |
Tip Plating for DUT | Au |
Tip Base for Loadboard | BeCu |
Tip Plating for Loadboard | Au |
Barrel Base | PhBz |
Barrel Plating | Au |
Spring Base | SUS with Gold Plating |
Full Travel | 0.8 |
Recommended Travel | 0.6 |
Spring Force | 20 |
Life Cycle | 200000 |