C.C.P. Contact Probes Co., LTD.
Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A
Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A
Category |
IC Test Probes
|
Part Number |
DE1-028EF40-05A0
|
Structure |
Double Active
|
Length |
5.70
|
Barrel Outer Diameter | |
Tip for DUT |
4 Points Serrated(P)
|
Tip for Load Board |
Conical 90º,120º(E)
|
Rated Current |
1
|
Contact Resistance |
250
|
Datasheet | DE1-028EF40-05A0 Datasheet.pdf |
3D CAD | DE1-028EF40-05A0.STEP |
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Ships from | Taiwan |
Lead Time | 21 |
Product Specifications
Impedance | 48.28 |
Insertion Loss | -1dB>20GHz |
Return Loss | -20dB@8.31GHz |
Tip Base for DUT | SK4 |
Tip Plating for DUT | Au |
Tip Base for Loadboard | SK4 |
Tip Plating for Loadboard | Au |
Barrel Base | Phosphor Bronze |
Barrel Plating | Au |
Spring Base | SWP with Au plated |
Full Travel | 1 |
Recommended Travel | 0.65 |
Spring Force | 28 |
Life Cycle | 200K |
Operating Temperature | -15~125 |