C.C.P. Contact Probes Co., LTD.
Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A
Double active, 5.7 mm, IC Test Probes, 0.28 mm Diameter, 1A
| Category |
IC Test Probes
|
| Part Number |
DE1-028DF40-01B0
|
| Structure |
Double Active
|
| Length |
5.70
|
| Barrel Outer Diameter | |
| Tip for DUT |
4 Points Crown(F)
|
| Tip for Load Board | |
| Rated Current |
1
|
| Contact Resistance |
150
|
| Datasheet | DE1-028DF40-01B0 Datasheet.pdf |
| 3D CAD | DE1-028DF40-01B0.STEP |
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| Ships from | Taiwan |
| Lead Time | 21 |
Product Specifications
| Impedance | 48.28 |
| Insertion Loss | -1dB>20GHz |
| Return Loss | -20dB@8.31GHz |
| Tip Base for DUT | BeCu Alloy |
| Tip Plating for DUT | Au |
| Tip Base for Loadboard | BeCu Alloy |
| Tip Plating for Loadboard | Au |
| Barrel Base | Phosphor Bronze |
| Barrel Plating | Au |
| Spring Base | SWP with Au plated |
| Full Travel | 1 |
| Recommended Travel | 0.65 |
| Spring Force | 28 |
| Life Cycle | 200K |
| Operating Temperature | -15~125 |