C.C.P. Contact Probes Co., LTD.
Double active, 4.75 mm, IC Test Probes, 0.3 mm Diameter, A
Double active, 4.75 mm, IC Test Probes, 0.3 mm Diameter, A
Category |
IC Test Probes
|
Part Number |
PE1-030DF32-01F0
|
Structure |
Double Active
|
Length |
4.75
|
Barrel Outer Diameter | |
Tip for DUT |
4 Points Crown(F)
|
Tip for Load Board |
Datasheet | PE1-030DF32-01F0 Datasheet.pdf |
3D CAD | PE1-030DF32-01F0.STEP |
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Ships from | Taiwan |
Lead Time | 21 |
Product Specifications
Tip Base for DUT | Pd Alloy |
Tip Plating for DUT | n/a |
Tip Base for Loadboard | BeCu Alloy |
Tip Plating for Loadboard | Au |
Barrel Base | Phosphor Bronze |
Barrel Plating | Au |
Spring Base | SUS with Au plated |
Full Travel | 0.85 |
Recommended Travel | 0.7 |
Spring Force | 38 |
Life Cycle | 200K |