C.C.P. Contact Probes Co., LTD.
18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147
18.93 mm, IC Test Probes, 0.75 mm Diameter, 3A, CM-M2-075-20147
Category |
IC Test Probes
|
Part Number |
CM-M2-075-20147
|
Structure |
Single Active
|
Length |
25.93
|
Barrel Outer Diameter | |
Tip for DUT |
Cup(A)
|
Rated Current |
3
|
Datasheet | CM-M2-075-20147 -.pdf |
3D CAD | CM-M2-075-20147.STEP |
Get a Quotation
Ships from | Taiwan |
Lead Time | 28 |
Product Specifications
Tip Base for DUT | BeCu |
Tip Plating for DUT | Gold |
Barrel Base | PhBz |
Barrel Plating | Gold |
Spring Base | SWP |
Spring Plating | Gold |
Full Travel | 2 |
Recommended Travel | 1 |
Spring Force | 150 |
Life Cycle | 100000 |
Description
CM-M2-075-20147 Single ended IC Test probe with a cone head, Gold plated.