尺寸量測顯微鏡

  2. 尺寸量測顯微鏡
  • Cold field emission (CFE) gun optimized for low-voltage, high-resolution imaging with low aberration
    (Regulus8220/8230/8240: 0.7 nm/1 kV; Regulus8100: 0.8 nm/1 kV)
  • Maximum magnification doubled from 1 million times to 2 million times*2
  • User-support functions to ensure high performance
Electron Microscope
Hitachi S-4800 SEM
被用於研究不同物質處於研究開發階段的原料特徵
Mechanical Performance